Post-bond Repair of Line Faults with Double-bit ECC for 3D Memory.
Younwoo YooHayoung LeeSeung Ho ShinSungho KangPublished in: ISOCC (2021)
Keyphrases
- repair actions
- random access memory
- error correction
- line segments
- fault diagnosis
- memory size
- error detection
- computing power
- fault detection
- memory usage
- model based diagnosis
- multiple faults
- magnetic tape
- fault isolation
- memory space
- elliptic curve
- virtual memory
- address space
- memory requirements
- line drawings
- failure rate
- limited memory
- random access
- computational power