A BIST Circuit for IDDQ Tests.

Masaki Hashizume Teppei Takeda Hiroyuki Yotsuyanagi Takeomi Tamesada Yukiya Miura Kozo Kinoshita

Published in: Asian Test Symposium (2003)

Keyphrases

high speed
real time
statistical tests
circuit design
analog circuits
databases
learning algorithm
feature selection
feature space
test cases
test data
correlation analysis