: Reducing test application time in high-level test generation.

Srivaths Ravi Ganesh Lakshminarayana Niraj K. Jha

Published in: ITC (2000)

Keyphrases

test generation
high level
test cases
test sequences
low level
mutation testing
symbolic execution
static analysis
software application
database
quality assurance
source code
programming language
test data generation
design automation
video sequences
artificial intelligence