CDM tests on interface test chips for the verification of ESD protection concepts.
Tilo BrodbeckKai EsmarkWolfgang StadlerPublished in: Microelectron. Reliab. (2009)
Keyphrases
- test generation
- test cases
- statistical tests
- test suite
- test data
- multiple choice
- post hoc
- high speed
- model checking
- concept learning
- neural network
- communication protocol
- formal verification
- integrated circuit
- user friendly
- real time
- software testing
- information security
- metadata
- learning algorithm
- direct manipulation
- test data generation
- test statistic
- flight test
- diagnostic tests
- code coverage