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A Test Generator for Segment Delay Faults.

Keerthi HeraguJanak H. PatelVishwani D. Agrawal
Published in: VLSI Design (1999)
Keyphrases
  • test cases
  • fault diagnosis
  • data generator
  • data mining
  • statistical significance
  • machine learning
  • website
  • multiscale
  • model based diagnosis
  • fault detection
  • test sequences
  • built in self test