Thin-film SOI PIN-diode leakage current dependence on back-gate-potential and HCI traps.

Andrei Schmidt Stefan Dreiner Holger Vogt Uwe Paschen

Published in: ESSDERC (2015)

Keyphrases

thin film
leakage current
short circuit
human computer interaction
high density
electrical properties
solar cell
silicon dioxide
low voltage
liquid crystal displays
multi layer
electron microscopy
film thickness
chemical vapor deposition
plasma etching
neural network
light emitting
power line
image processing