Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation.
Vassilios D. VassiosArgyrios T. HatzopoulosIoannis G. IntzesDimitrios K. PapakostasPublished in: MOCAST (2024)
Keyphrases
- fault detection
- fault diagnosis
- analog circuits
- industrial processes
- fault identification
- tennessee eastman
- condition monitoring
- neural network
- expert systems
- fault localization
- digital circuits
- robust fault detection
- fault detection and diagnosis
- failure detection
- fuel cell
- constraint satisfaction
- np complete
- design process
- fuzzy logic
- query language
- pattern recognition
- artificial intelligence