Flexible test mode approach for 256-Mb DRAM.

Toshiaki Kirihata Hing Wong John K. DeBrosse Yohji Watanabe Takahiko Hara Munehiro Yoshida Matthew R. Wordeman Shuso Fujii Yoshiaki Asao Bo Krsnik

Published in: IEEE J. Solid State Circuits (1997)

Keyphrases