Bo Krsnik

Publication Activity (10 Years)

Years Active: 1997-1997
Publications (10 Years): 0

Publications

Toshiaki Kirihata, Hing Wong, John K. DeBrosse, Yohji Watanabe, Takahiko Hara, Munehiro Yoshida, Matthew R. Wordeman, Shuso Fujii, Yoshiaki Asao, Bo Krsnik
Flexible test mode approach for 256-Mb DRAM. IEEE J. Solid State Circuits 32 (10) (1997)