Transition Fault Testability in Bit Parallel Multipliers over GF(2^{m}).

Hafizur Rahaman Jimson Mathew Biplab K. Sikdar Dhiraj K. Pradhan

Published in: VTS (2007)

Keyphrases

bit parallel
pattern matching
fault diagnosis
regular expressions
fault detection
multiple faults
state transition
lagrangian relaxation
test data generation
galois field
neural network
simulated annealing
failure modes
transition model
fault model
normal operation