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Test generation for scan design circuits with tri-state modules and bidirectional terminals.
Takuji Ogihara
Shinichi Murai
Yuzo Takamatsu
Kozo Kinoshita
Hideo Fujiwara
Published in:
DAC (1983)
Keyphrases
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test generation
design automation
case study
design process
user interface
circuit design
digital circuits
logic circuits
decision trees
open source
modular architecture
logic synthesis
chip design
mutation testing
high level synthesis