Integrated sensor for light source position measurement applicable in SOI technology.
Christian KochJürgen OehmJannik EmdeWolfram BuddePublished in: ESSCIRC (2007)
Keyphrases
- light source
- light intensity
- single image
- shape from shading
- photometric stereo
- surface normals
- lighting conditions
- multiple images
- single point
- object surface
- structured light
- illumination conditions
- multiple light sources
- specular reflection
- real objects
- surface reflectance
- ambient illumination
- position and orientation
- ground plane
- surface orientation
- cast shadows
- reflectance properties
- illumination direction
- specular highlights