MULTIPLE LIGHT SOURCES
Experts
- Paul E. Debevec
- Edwin R. Hancock
- Takashi Matsuyama
- Philip L. Worthington
- Eiji Oki
- Hiroyuki Ukida
- Yueping Cai
- Ian T. Foster
- Naoto Kishi
- Yuji Iwahori
- Tetsuya Miki
- Katsushi Ikeuchi
- Motoharu Matsuura
- Luc Van Gool
- Jong-Ok Kim
- Shoji Tominaga
- Pieter Peers
- Pauli Fält
- Takahiko Horiuchi
- Rajkumar Kettimuthu
- Toshikazu Wada
- Markku Hauta-Kasari
- Ko Nishino
- Eugene Fiume
- Michael Breuß
- Michael S. Langer
- Sven Loncaric
- Keita Hirai
- Abhijeet Ghosh
- Stamatios Georgoulis
- Mateu Sbert
- Shigeki Nakauchi
- Tekin Bicer
- Rama Chellappa
- Jun-Sang Yoo
- Marko Subasic
- Atsuto Maki
- Chun-Jen Weng
- Andrew Zisserman
Venues
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- OFC
- Sensors
- CIC
- ICCV
- ICPR
- IEEE Access
- IEICE Electron. Express
- Comput. Graph. Forum
- Color Imaging Conference
- IEICE Trans. Electron.
- ICIP
- Comput. Vis. Image Underst.
- ICRA
- ACM Trans. Graph.
- SIGGRAPH Talks
- Displays
- BMVC
- Comput. Graph.
- Int. J. Comput. Vis.
- EMBC
- PICS
- Pattern Recognit.
- Rendering Techniques
- Remote. Sens.
- I2MTC
- MVA
- SMC
- SIGGRAPH Posters
- ICPR (1)
- CGIV
- Neural Networks
- IEEE Trans. Instrum. Meas.
- Systems and Computers in Japan
- CGIV/MCS
- Entropy
- ECCV (1)
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