MULTIPLE LIGHT SOURCES
Experts
- Paul E. Debevec
- Edwin R. Hancock
- Takashi Matsuyama
- Philip L. Worthington
- Hiroyuki Ukida
- Eiji Oki
- Pauli Fält
- Yuji Iwahori
- Jong-Ok Kim
- Katsushi Ikeuchi
- Shoji Tominaga
- Luc Van Gool
- Takahiko Horiuchi
- Ian T. Foster
- Yueping Cai
- Motoharu Matsuura
- Pieter Peers
- Naoto Kishi
- Tetsuya Miki
- Keita Hirai
- Eugene Fiume
- Michael Breuß
- Tekin Bicer
- Marko Subasic
- Shigeki Nakauchi
- Atsuto Maki
- Jun-Sang Yoo
- Ko Nishino
- Markku Hauta-Kasari
- Michael S. Langer
- Rajkumar Kettimuthu
- Stamatios Georgoulis
- Sven Loncaric
- Rama Chellappa
- Toshikazu Wada
- Mateu Sbert
- Abhijeet Ghosh
- Giuseppe Claudio Guarnera
- Mark S. Drew
Venues
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- OFC
- Sensors
- CIC
- IEEE Access
- ICCV
- ICPR
- IEICE Electron. Express
- Color Imaging Conference
- Comput. Graph. Forum
- IEICE Trans. Electron.
- Comput. Vis. Image Underst.
- ICIP
- ICRA
- ACM Trans. Graph.
- Int. J. Comput. Vis.
- Displays
- EMBC
- Comput. Graph.
- BMVC
- SIGGRAPH Talks
- CGIV/MCS
- IEEE Trans. Instrum. Meas.
- Neural Networks
- Pattern Recognit.
- SMC
- Systems and Computers in Japan
- CGIV
- Rendering Techniques
- I2MTC
- Entropy
- MVA
- ICPR (1)
- Remote. Sens.
- SIGGRAPH Posters
- PICS
- J. Electronic Imaging
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend