MULTIPLE LIGHT SOURCES
Experts
- Paul E. Debevec
- Edwin R. Hancock
- Takashi Matsuyama
- Hiroyuki Ukida
- Eiji Oki
- Philip L. Worthington
- Katsushi Ikeuchi
- Tetsuya Miki
- Yuji Iwahori
- Naoto Kishi
- Ian T. Foster
- Yueping Cai
- Pauli Fält
- Takahiko Horiuchi
- Luc Van Gool
- Jong-Ok Kim
- Motoharu Matsuura
- Pieter Peers
- Shoji Tominaga
- Michael Breuß
- Sven Loncaric
- Michael S. Langer
- Ko Nishino
- Eugene Fiume
- Markku Hauta-Kasari
- Toshikazu Wada
- Rajkumar Kettimuthu
- Atsuto Maki
- Marko Subasic
- Rama Chellappa
- Jun-Sang Yoo
- Shigeki Nakauchi
- Mateu Sbert
- Tekin Bicer
- Abhijeet Ghosh
- Keita Hirai
- Stamatios Georgoulis
- Robert R. Bitmead
- Alamin Mansouri
Venues
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- OFC
- CIC
- Sensors
- ICPR
- ICCV
- IEICE Electron. Express
- IEEE Access
- Color Imaging Conference
- Comput. Graph. Forum
- IEICE Trans. Electron.
- ICRA
- Comput. Vis. Image Underst.
- ICIP
- ACM Trans. Graph.
- EMBC
- Int. J. Comput. Vis.
- Comput. Graph.
- BMVC
- Displays
- SIGGRAPH Talks
- SMC
- SIGGRAPH Posters
- MVA
- I2MTC
- Rendering Techniques
- Remote. Sens.
- Pattern Recognit.
- PICS
- Entropy
- Systems and Computers in Japan
- CGIV/MCS
- Neural Networks
- IEEE Trans. Instrum. Meas.
- ICPR (1)
- CGIV
- ICAIT
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