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Delta-IDDQ Testing of Resistive Short Defects.

Piet EngelkeIlia PolianHans ManhaeveMichel RenovellBernd Becker
Published in: ATS (2006)
Keyphrases
  • real time
  • data mining
  • test cases
  • defect detection
  • database
  • neural network
  • artificial intelligence
  • search engine
  • evolutionary algorithm
  • recognition rate
  • random forest
  • test generation
  • defect classification