Delta-IDDQ Testing of Resistive Short Defects.

Piet Engelke Ilia Polian Hans Manhaeve Michel Renovell Bernd Becker

Published in: ATS (2006)

Keyphrases

real time
data mining
test cases
defect detection
database
neural network
artificial intelligence
search engine
evolutionary algorithm
recognition rate
random forest
test generation
defect classification