Search Space Reduction for Low-Power Test Generation.
Kohei MiyaseMatthias SauerBernd BeckerXiaoqing WenSeiji KajiharaPublished in: Asian Test Symposium (2013)
Keyphrases
- low power
- test generation
- search space reduction
- low cost
- high speed
- power consumption
- test cases
- search space
- static analysis
- logic circuits
- low power consumption
- software testing
- high power
- single chip
- vlsi architecture
- quality assurance
- digital signal processing
- vlsi circuits
- cost function
- image quality
- wireless transmission
- gate array
- ultra low power
- nm technology
- computer vision
- quality control