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3D integration: Circuit design, test, and reliability challenges.

Nikolaos MinasIngrid De WolfErik Jan MarinissenMichele StucchiHerman OprinsAbdelkarim MerchaGeert Van der PlasDimitrios VelenisPol Marchal
Published in: IOLTS (2010)
Keyphrases
  • circuit design
  • lessons learned
  • digital circuits
  • data fusion
  • key issues
  • real world
  • infrared
  • design automation
  • databases
  • neural network
  • genetic algorithm
  • test data
  • biologically inspired
  • technical solutions