DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests.
Satya TrinadhCh. Sobhan BabuShiv Govind SinghSeetal PotluriV. KamakotiPublished in: DATE (2015)
Keyphrases
- dynamic programming
- state space
- statistical tests
- test cases
- dp matching
- test generation
- test data
- markov decision processes
- test suite
- greedy algorithm
- single machine
- diagnostic tests
- multiple choice
- optimal policy
- linear programming
- coarse to fine
- stereo matching
- piecewise linear
- power consumption
- optimal control
- null hypothesis
- test statistic
- control system
- power reduction
- information systems
- post hoc
- reinforcement learning