Fast Antirandom (FAR) Test Generation.

Anneliese von Mayrhauser Andre Bai Tom Chen Charles Anderson Amjad Hajjar

Published in: HASE (1998)

Keyphrases

test generation
test cases
test sequences
symbolic execution
quality assurance
static analysis
mutation testing
software testing
design automation
regression testing
code coverage
machine learning
high frequency
cooperative
high level
feature selection
computer vision