Sequential Test Generation Based on Circuit Pseudo-Transformation.

Satoshi Ohtake Tomoo Inoue Hideo Fujiwara

Published in: Asian Test Symposium (1997)

Keyphrases

test generation
test cases
test sequences
symbolic execution
design automation
quality assurance
circuit design
static analysis
mutation testing
code coverage
high speed
software testing
database
cooperative
relational databases
machine learning
databases