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Hardware accelerated constrained random test generation.
Bhaskar Pal
Arnab Sinha
Pallab Dasgupta
P. P. Chakrabarti
Kaushik De
Published in:
IET Comput. Digit. Tech. (2007)
Keyphrases
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test generation
test cases
test sequences
design automation
static analysis
symbolic execution
mutation testing
software testing
quality assurance
test data generation
cooperative
high quality
machine learning
test set
training data
regression testing
databases
code coverage
data sets