SAT-based generation of compressed skewed-load tests for transition delay faults.

Roland Dobai Marcel Baláz

Published in: Microprocess. Microsystems (2013)

Keyphrases

test cases
load balancing
fault diagnosis
data structure
sat solvers
data compression
answer set programming
fault detection
ai planning
bounded model checking
image quality
closed loop
learning algorithm
statistical tests
compressed domain
constraint solver
multiple faults