Modular test generation and concurrent transparency-based test translation using gate-level ATPG.

Yiorgos Makris Alex Orailoglu Praveen Vishakantaiah

Published in: CICC (2000)

Keyphrases

test generation
test cases
test sequences
symbolic execution
design automation
static analysis
mutation testing
quality assurance
software testing
image data
test data generation
open source
code coverage
test suite
machine learning
machine translation
image quality
information technology
high level
image processing