Delay Fault Models and Test Generation for Random Logic Sequential Circuits.

Tapan J. Chakraborty Vishwani D. Agrawal Michael L. Bushnell

Published in: DAC (1992)

Keyphrases

fault models
test generation
model based diagnosis
test cases
fault management
horn clauses
fault model
conflict resolution
quality assurance
software testing
static analysis
network management
fault tolerance
information systems
dynamic systems
relational databases
case study