Testing for Bounded Faults in RAMs.

R. David Janusz A. Brzozowski Helmut Jürgensen

Published in: J. Electron. Test. (1997)

Keyphrases

test cases
fault model
fault diagnosis
test suite
test generation
real world
social networks
decision trees
test set
software testing
neural network
knowledge base
model based diagnosis
fault detection
asymptotically optimal
test sequences