• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Design fault directed test generation for microprocessor validation.

Deepak MathaikuttySandeep K. ShuklaSreekumar V. KodakaraDavid J. LiljaAjit Dingankar
Published in: DATE (2007)
Keyphrases