Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits.
Yukiya MiuraShuichi SenoPublished in: J. Electron. Test. (2002)
Keyphrases
- behavior analysis
- analog vlsi
- delay insensitive
- high speed
- circuit design
- vlsi circuits
- cmos technology
- anomaly detection
- fault diagnosis
- fault detection
- built in self test
- floating gate
- random access memory
- behavior patterns
- chip design
- power consumption
- surveillance system
- power dissipation
- focal plane
- fault models
- low power
- smart phones
- asynchronous circuits
- social insects
- training data
- fault model
- low voltage
- text classification
- low cost
- pairwise
- preprocessing