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Shuichi Seno
Publication Activity (10 Years)
Years Active: 2001-2002
Publications (10 Years): 0
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Publications
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Yukiya Miura
,
Shuichi Seno
Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits.
J. Electron. Test.
18 (2) (2002)
Yukiya Miura
,
Shuichi Seno
Internal feedback bridging faults in combinational CMOS circuits: analysis and testing.
ETW
(2001)