Shuichi Seno

Publication Activity (10 Years)

Years Active: 2001-2002
Publications (10 Years): 0

Publications

Yukiya Miura, Shuichi Seno
Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits. J. Electron. Test. 18 (2) (2002)
Yukiya Miura, Shuichi Seno
Internal feedback bridging faults in combinational CMOS circuits: analysis and testing. ETW (2001)