Deriving Signal Constraints to Accelerate Sequential Test Generation.

Srimat T. Chakradhar Vijay Gangaram Steven G. Rothweiler

Published in: VLSI Design (1997)

Keyphrases

test generation
signal processing
test cases
test sequences
design automation
symbolic execution
quality assurance
mutation testing
frequency domain
static analysis
computer vision
metadata
multi agent systems
xml documents
high frequency
software testing