Login / Signup

Reformatting Test Patterns for Testing Embedded Core Based System Using Test Access Mechanism (TAM) Switch.

Subhayu BasuDebdeep MukhopadhyayDipanwita Roy ChowdhuryIndranil SenguptaSudipta Bhawmik
Published in: VLSI Design (2002)
Keyphrases
  • test cases
  • test sequences
  • test data
  • software testing
  • testing process
  • social networks
  • test generation
  • real time
  • neural network
  • web pages
  • e learning
  • access control
  • test set
  • computational model
  • test data generation