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Accumulator-based BIST approach for stuck-open and delay fault testing.
Ioannis Voyiatzis
Antonis M. Paschalis
Dimitris Nikolos
Constantin Halatsis
Published in:
ED&TC (1995)
Keyphrases
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fault model
fault diagnosis
hough transform
fault injection
critical path
fault detection
real time embedded systems
multiple faults
test cases
computer vision
end to end
software testing
test generation
web services
normal operation
information retrieval
real world
real time