Identification of primitive faults in combinational and sequentialcircuits.
Ramesh C. TekumallaPremachandran R. MenonPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2001)
Keyphrases
- fault diagnosis
- machine learning
- genetic algorithm
- information systems
- case study
- fault detection
- information technology
- previously identified
- databases
- parameter identification
- error detection
- test cases
- probabilistic model
- expert systems
- data structure
- multi agent
- face recognition
- database systems
- image processing
- computer vision
- artificial intelligence