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Built-In Self Testing of Sequential Circuits Using Precomputed Test Sets.

Vikram IyengarKrishnendu ChakrabartyBrian T. Murray
Published in: VTS (1998)
Keyphrases
  • test set
  • test cases
  • error rate
  • training set
  • test data
  • training data
  • evaluation methodology
  • neural network
  • high speed
  • digital circuits
  • asynchronous circuits
  • logic synthesis
  • training and test sets
  • tunnel diode