PUF-Based Secure Test Wrapper for SoC Testing.
Sudeendra Kumar KSaurabh SethSauvagya Ranjan SahooAbhishek MahapatraAyas Kanta SwainKamalakanta MahapatraPublished in: ISVLSI (2018)
Keyphrases
- test cases
- hardware software co design
- software testing
- black box
- test data
- statistical tests
- test suite
- feature selection
- integration testing
- test generation
- testing process
- information extraction
- low power
- hardware and software
- neural network
- model based testing
- test case generation
- test data generation
- machine learning
- test set
- usability testing
- test sequences
- security analysis
- key management
- security mechanisms
- smart card