Defect detection for CCGA solder column based on machine vision.
Qili HouYang WangBanghua ChenSong XuLihong YangPublished in: ICMLC (2024)
Keyphrases
- defect detection
- machine vision
- image processing
- automated visual inspection
- quality control
- vision system
- imaging systems
- character recognition
- feature extraction
- surface inspection
- computer vision
- column oriented
- mechanical properties
- failure rate
- surface defects
- machine learning
- binary matrix
- printed circuit boards
- semiconductor devices
- three dimensional
- neural network