Multiple Fault Detection for Combinational Logic Circuits.
Stephen S. YauShih-Chien YangPublished in: IEEE Trans. Computers (1975)
Keyphrases
- fault detection
- logic circuits
- fault diagnosis
- low power
- industrial processes
- fault identification
- gate array
- fuel cell
- fault detection and diagnosis
- fault localization
- condition monitoring
- high speed
- fault isolation
- tunnel diode
- tennessee eastman
- failure detection
- functional decomposition
- hidden markov models
- neural network
- real time