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Test limitations of parametric faults in analog circuits.

Jacob SavirZhen Guo
Published in: IEEE Trans. Instrum. Meas. (2003)
Keyphrases
  • analog circuits
  • fault diagnosis
  • test cases
  • neural network
  • digital circuits
  • wavelet packet transform
  • multiple faults
  • parametric models
  • knowledge representation
  • fault detection