Measurement of Light Sensitivity of Chromium/Porous Silicon Schottky Diodes Made by Silicon Nitride Masking.
Karthik SelvamSuma RajashankarMichael J. Haji-SheikhPublished in: ICST (2018)
Keyphrases
- high density
- thin film
- silicon dioxide
- liquid crystal
- light intensity
- semiconductor devices
- data center
- sensitivity analysis
- field effect transistors
- contrast sensitivity
- human visual system
- plasma etching
- high temperature
- room temperature
- high sensitivity
- high speed
- space charge
- electrical properties
- chemical vapor deposition
- low cost
- neural network
- database