Login / Signup
Broadside Transition Test Generation for Partial Scan Circuits through Stuck-at Test Generation.
Tsuyoshi Iwagaki
Satoshi Ohtake
Hideo Fujiwara
Published in:
VLSI-SoC (Selected Papers) (2006)
Keyphrases
</>
test generation
test cases
static analysis
test sequences
symbolic execution
mutation testing
design automation
quality assurance
software testing
high speed
test data generation
data sets
databases
artificial intelligence
error rate