ESD Protection for Mixed-Voltage I/O in LowVoltage Thin-Oxide CMOS.
Ming-Dou KerWei-Jen ChangChang-Tzu WangWen-Yi ChenPublished in: ISSCC (2006)
Keyphrases
- low voltage
- power supply
- electrical properties
- metal oxide
- room temperature
- leakage current
- gate dielectrics
- high speed
- silicon dioxide
- input output
- main memory
- power consumption
- design considerations
- solid state
- high voltage
- low cost
- field effect transistors
- fuel cell
- cmos technology
- si sio
- random access memory
- power system
- x ray
- circuit design
- low power
- data protection
- transmission line
- cmos image sensor
- privacy protection
- information security