A New Test Generation Approach for Embedded Analogue Cores in SoC.
M. StancicLiquan FangM. H. H. WeusthofR. M. W. TijinkHans G. KerkhoffPublished in: ITC (2002)
Keyphrases
- test generation
- embedded systems
- test cases
- test sequences
- design automation
- symbolic execution
- quality assurance
- software testing
- dynamic random access memory
- static analysis
- mutation testing
- image processing
- low power
- hardware and software
- data sets
- error rate
- low cost
- image data
- data model
- high level
- computer vision
- databases