Reduction of momentum and spin relaxation rate in strained thin silicon films.

Dmitry Osintsev Viktor Sverdlov Siegfried Selberherr

Published in: ESSDERC (2013)

Keyphrases

silicon dioxide
space charge
chemical vapor deposition
learning rate
transmission electron microscopy
low cost
high speed
edge detection
reduction method
iterative algorithms
gate dielectrics
data sets
neural network
growth rate
electrical properties