Random Pattern Testing for Address-Line Faults in an Embedded Multiport Memory.
Jacob SavirWilliam H. McAnneySalvatore R. VecchioPublished in: ITC (1985)
Keyphrases
- test cases
- fault diagnosis
- fault model
- pattern matching
- model based diagnosis
- computational power
- case study
- memory requirements
- pattern discovery
- line segments
- repair actions
- pattern detection
- test generation
- uniformly distributed
- memory usage
- database
- evolutionary algorithm
- data structure
- learning algorithm
- neural network
- real time