William H. McAnney

Publication Activity (10 Years)

Years Active: 1982-1992
Publications (10 Years): 0

Publications

Jacob Savir, William H. McAnney
A Multiple Seed Linear Feedback Shift Register. IEEE Trans. Computers 41 (2) (1992)
Jacob Savir, William H. McAnney, Salvatore R. Vecchio
Testing for Coupled Cells in Random-Access Memories. IEEE Trans. Computers 40 (10) (1991)
Jacob Savir, William H. McAnney
A multiple seed linear feedback shift register. ITC (1990)
Jacob Savir, William H. McAnney, Salvatore R. Vecchio
Testing for Coupled Cells in Random-Access Memories. ITC (1989)
Paul H. Bardell, William H. McAnney
Built-in test for RAMs. IEEE Des. Test 5 (4) (1988)
William H. McAnney, Jacob Savir
Built-In Checking of the Correct Self-Test Signature. IEEE Trans. Computers 37 (9) (1988)
Jacob Savir, William H. McAnney
Identification of Failing Tests with Cycling Registers. ITC (1988)
Jacob Savir, William H. McAnney
Random Pattern Testability of Delay Faults. IEEE Trans. Computers 37 (3) (1988)
Jacob Savir, William H. McAnney, Salvatore R. Vecchio
Fault Propagation Through Embedded Multiport Memories. IEEE Trans. Computers 36 (5) (1987)
Paul H. Bardell, William H. McAnney
Pseudorandom Arrays for Built-In Tests. IEEE Trans. Computers 35 (7) (1986)
William H. McAnney, Jacob Savir
Built-In Checking of the Correct Self-Test Signature. ITC (1986)
Jacob Savir, William H. McAnney
Random Pattern Testability of Delay Faults. ITC (1986)
Jacob Savir, William H. McAnney, Salvatore R. Vecchio
Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory. ITC (1985)
Jacob Savir, William H. McAnney, Salvatore R. Vecchio
Random Pattern Testing for Address-Line Faults in an Embedded Multiport Memory. ITC (1985)
Paul H. Bardell, William H. McAnney
Self-Test of Random Access Memories. ITC (1985)
Paul H. Bardell, William H. McAnney
Parallel Pseudorandom Sequences for Built-In Test. ITC (1984)
William H. McAnney, Paul H. Bardell, V. P. Gupta
Random Testing for Stuck-At Storage Cells in an Embedded Memory. ITC (1984)
Paul H. Bardell, William H. McAnney
Self-Testing of Multichip Logic Modules. ITC (1982)