Random Testing for Stuck-At Storage Cells in an Embedded Memory.
William H. McAnneyPaul H. BardellV. P. GuptaPublished in: ITC (1984)
Keyphrases
- memory capacity
- random access
- secondary storage
- limited memory
- storage media
- memory storage
- embedded systems
- data storage
- memory requirements
- virtual memory
- storage devices
- computing power
- test cases
- flash memory
- memory access
- storage requirements
- disk storage
- data transfer
- disk access
- main memory
- uniformly distributed
- computational power
- test data
- dynamic random access memory
- memory subsystem
- genetic algorithm
- memory size
- memory management
- external memory
- storage capacity
- memory space
- memory usage
- storage space
- test set