Paul H. Bardell

Publication Activity (10 Years)

Years Active: 1982-1993
Publications (10 Years): 0

Publications

Jacob Savir, Paul H. Bardell
Built-In Self-Test: Milestones and Challenges. VLSI Design 1 (1) (1993)
Paul H. Bardell
Primitive polynomials of degree 301 through 500. J. Electron. Test. 3 (2) (1992)
Paul H. Bardell
Calculating the effects of linear dependencies in m-sequences used as test stimuli. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11 (1) (1992)
Paul H. Bardell
Discrete logarithms a parallel pseudorandom pattern generator analysis method. J. Electron. Test. 3 (1) (1992)
Paul H. Bardell, Michael J. Lapointe
Production Experience with Built-In Self-Test in the IBM ES/9000 System. ITC (1991)
Jacob Savir, Paul H. Bardell
Partitioning of polynomial tasks: test generation, an example. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10 (11) (1991)
Paul H. Bardell
Analysis of cellular automata used as pseudorandom pattern generators. ITC (1990)
Paul H. Bardell
Design considerations for Parallel pseudoRandom Pattern Generators. J. Electron. Test. 1 (1) (1990)
Paul H. Bardell
Calculating the Effects of Linear Dependencies in m-Sequences Used as Test Stimuli. ITC (1989)
Paul H. Bardell, William H. McAnney
Built-in test for RAMs. IEEE Des. Test 5 (4) (1988)
Paul H. Bardell
TTTC 10th Anniversary. IEEE Des. Test 4 (4) (1987)
Paul H. Bardell, William H. McAnney
Pseudorandom Arrays for Built-In Tests. IEEE Trans. Computers 35 (7) (1986)
Paul H. Bardell, William H. McAnney
Self-Test of Random Access Memories. ITC (1985)
Paul H. Bardell, William H. McAnney
Parallel Pseudorandom Sequences for Built-In Test. ITC (1984)
William H. McAnney, Paul H. Bardell, V. P. Gupta
Random Testing for Stuck-At Storage Cells in an Embedded Memory. ITC (1984)
Jacob Savir, Paul H. Bardell
On Random Pattern Test Length. IEEE Trans. Computers 33 (6) (1984)
Jacob Savir, Gary S. Ditlow, Paul H. Bardell
Random Pattern Testability. IEEE Trans. Computers 33 (1) (1984)
Jacob Savir, Paul H. Bardell
On Random Pattern Test Length. ITC (1983)
Paul H. Bardell, William H. McAnney
Self-Testing of Multichip Logic Modules. ITC (1982)