Impact of Topology-Related Attributes from Local Binary Patterns on Texture Classification.
Thanh Phuong NguyenAntoine ManzaneraWalter G. KropatschPublished in: ECCV Workshops (2) (2014)
Keyphrases
- texture classification
- local binary pattern
- texture analysis
- rotation invariant
- texture features
- texture images
- spatial information
- feature extraction
- face recognition
- multiscale
- face detection
- texture descriptors
- image texture
- image analysis
- background subtraction
- texture information
- feature descriptors
- image descriptors
- gray level
- preprocessing
- scale invariant
- filter responses
- support vector machine
- pattern recognition