Packaging Defect Detection System Based on Machine Vision and Deep Learning.
Jiming SaZhihao LiQijun YangXuan ChenPublished in: ICCCS (2020)
Keyphrases
- deep learning
- defect detection
- machine vision
- automated visual inspection
- quality control
- image processing
- vision system
- machine learning
- unsupervised learning
- unsupervised feature learning
- character recognition
- feature extraction
- high density
- computer vision
- mental models
- weakly supervised
- decision makers
- surface inspection
- surface defects
- pairwise
- deep architectures
- data mining
- real time