Photoluminescence Imaging for Industrial Quality Control during Manufacturing of Thin-Film Solar Cells.
Johanna ZikulnigWolfgang MühleisenMarcel SimorVeronique GevaertsMartin De BiasioPublished in: IEEE SENSORS (2022)
Keyphrases
- quality control
- thin film
- automated visual inspection
- surface inspection
- quality improvement
- machine vision
- quality assurance
- image processing
- manufacturing systems
- manufacturing process
- high density
- product quality
- short circuit
- white light interferometry
- multi layer
- solar cell
- electron microscopy
- high resolution
- manufacturing industry
- manufacturing enterprises
- computer vision
- wireless sensor networks
- feature extraction