Light Source Position Measurement Technique Applicable in SOI Technology.
Christian KochJürgen OehmJannik EmdeWolfram BuddePublished in: IEEE J. Solid State Circuits (2008)
Keyphrases
- light source
- shape from shading
- light intensity
- photometric stereo
- single image
- surface normals
- illumination conditions
- object surface
- multiple images
- lighting conditions
- multiple light sources
- structured light
- reflectance properties
- cast shadows
- lighting direction
- specular highlights
- specular reflection
- single point
- high quality
- lambertian surface
- ground plane
- surface orientation
- position and orientation
- computer vision
- optical flow
- three dimensional