LAMBERTIAN SURFACE
Experts
- Yasuyuki Matsushita
- Roberto Mecca
- Boxin Shi
- Jean-Louis Roujean
- Daniel Cremers
- Dominique Carrer
- Paul E. Debevec
- Alfred M. Bruckstein
- Osamu Ikeda
- Imari Sato
- Roberto Cipolla
- Yvain Quéau
- Jianguang Wen
- Qiang Liu
- Koichiro Deguchi
- David J. Kriegman
- Takayuki Okatani
- Yoichi Sato
- Shunlin Liang
- Ping Tan
- Junyu Dong
- Ryszard Kozera
- Feng Lu
- Katsushi Ikeuchi
- Jean-Denis Durou
- Michael S. Langer
- Kwan-Yee K. Wong
- William A. P. Smith
- Guanying Chen
- Melvyn L. Smith
- Ron Kimmel
- Takahiro Okabe
- Vasileios Argyriou
- Jonathan T. Barron
- Takashi Matsuyama
- Maria Petrou
- Olivier Hautecoeur
- Qing Xiao
- Pierre Poulin
Venues
- Remote. Sens.
- CVPR
- CoRR
- IGARSS
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- Int. J. Comput. Vis.
- IEEE Trans. Geosci. Remote. Sens.
- ICPR
- ACM Trans. Graph.
- Comput. Graph. Forum
- Sensors
- Pattern Recognit. Lett.
- Comput. Vis. Image Underst.
- BMVC
- 3DV
- ECCV (2)
- Image Vis. Comput.
- ICIP
- Int. J. Appl. Earth Obs. Geoinformation
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Rendering Techniques
- ICCP
- CVPR (1)
- CRV
- ECCV (4)
- Comput. Graph.
- WACV
- IROS
- IEEE Trans. Image Process.
- ICRA
- MVA
- J. Electronic Imaging
- Pattern Recognit.
- Multim. Tools Appl.
- Systems and Computers in Japan
- J. Math. Imaging Vis.
- IJCAI
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